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In situ compression tests on micron-sized silicon pillars by Raman microscopy—Stress measurements and deformation analysis
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- Journal:
- Journal of Materials Research / Volume 23 / Issue 11 / November 2008
- Published online by Cambridge University Press:
- 31 January 2011, pp. 3040-3047
- Print publication:
- November 2008
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Strength and fracture of Si micropillars: A new scanning electron microscopy-based micro-compression test
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- Journal:
- Journal of Materials Research / Volume 22 / Issue 4 / April 2007
- Published online by Cambridge University Press:
- 03 March 2011, pp. 1004-1011
- Print publication:
- April 2007
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Fracture mechanisms of GaAs under nanoscratching
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- Journal:
- MRS Online Proceedings Library Archive / Volume 841 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, R9.15
- Print publication:
- 2004
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