7 results
Pivot Point: The Key to TEM Automation
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2920-2921
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- August 2022
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Doing More with Less: Artificial Intelligence Guided Analytics for Electron Microscopy Applications
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2988-2989
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- August 2022
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An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press:
- 10 June 2022, pp. 1611-1621
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- October 2022
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The role of Nanocartography in the Development of Automated TEM
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2986-2987
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- August 2021
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Elements Authors Highlight: Nanocartography
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, p. 3458
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- August 2021
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NanoCartography: Mathematics of Crystal Orientation in Double Tilt Holders
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 252-253
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- August 2020
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Nanocartography in the Age of Automated TEM
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, p. 32
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- August 2020
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