11 results
Characterization of Localized Degradation in Reverse-Biased GaN HEMTs by Scanning Transmission Electron Microscopy and Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 800-801
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- July 2010
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Hole Accumulation in Ge/Si Core/Shell Nanowires Studied by Electron Holography
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 566-567
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- July 2010
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Holographic Phase Imaging of Charged Threading Dislocation in 4H-SiC
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 564-565
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- July 2010
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Direct Observation of Magnetic Domain Wall Propagation in NiFe Nanowires
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 574-575
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- July 2010
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Field Mapping and Ohmic Contacts for AlGaN- or AlInN-Based Heterojunction Field Effect Transistors
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 570-571
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- July 2010
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Mapping Polarization Fields in Al0.85In0.15N/AlN/GaN Heterostructures
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1048-1049
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- July 2009
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Polarization Field Mapping of AlGaN/GaN HEMT Devices using Lorentz-mode Electron Holography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1236-1237
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- July 2009
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Study of Epitaxial Germanium Quantum Dots in Silicon by Off-axis Electron Holography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 404-405
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- August 2008
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Electrostatic Potential Mapping across AlGaAs/AlAs/GaAs Heterostructure
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 16-17
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- August 2008
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In-Situ Characterization of 2D Potential Distributions in Biased Si n+-p Junctions Using Off-Axis Electron Holography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 400-401
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- August 2008
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Phase Shifting Reconstruction for High Resolution Electron Holography
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1712-1713
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- August 2006
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