4 results
Elemental Quantification and Experimental Measurement of Mean Free Path Using EELS and CBED at 30 keV
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2744-2746
- Print publication:
- August 2022
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EDS of Lithium Materials from 0.5 to 30 keV
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1868-1869
- Print publication:
- August 2021
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Low-voltage STEM-EELS Quantification for Beam Sensitive Material Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1206-1208
- Print publication:
- August 2020
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Metallic Copper Clusters Decorating Cu Ferrites Revealed by Deep Data Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 542-543
- Print publication:
- August 2018
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