3 results
UV Raman Spectroscopy Study of Strain Induced by Buried Silicon Nitride Layer in the BOX of Silicon On Insulator Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1185 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1185-II04-08
- Print publication:
- 2009
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Strain Determination Around Vickers Indentation on Silicon Surface by Raman Spectroscopy
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- Journal:
- Journal of Materials Research / Volume 19 / Issue 4 / April 2004
- Published online by Cambridge University Press:
- 03 March 2011, pp. 1273-1280
- Print publication:
- April 2004
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Residual strain field in indented GaAs
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- Journal:
- Journal of Materials Research / Volume 18 / Issue 6 / June 2003
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1474-1480
- Print publication:
- June 2003
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