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Recent Developments in Silicon Drift Detector Technology: Atomic to mm Scale
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1170-1171
- Print publication:
- July 2011
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News on Silicon Drift Detectors for X-Ray Nanoanalysis in S/TEM
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 2-3
- Print publication:
- July 2010
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Element Distribution in Novel Hedgehog-Like Magnetic Nanostructures Studied by, Cs-Corrected STEM-EELS and Uncorrected STEM-XEDS Using SDD-Technology
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1214-1215
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- July 2009
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XEDS with SDD-Technology in Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 202-203
- Print publication:
- July 2009
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