6 results
Chemical Characterization of Material Surfaces Using X-ray Photoelectron Spectroscopy (XPS): The Perfect Complement to Electron Microscopy Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2062-2063
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- August 2014
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Advanced Surface Characterisation with X-ray Photoelectron Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 32-33
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- July 2010
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Characterizing New Energy Materials Using a Multi-Technique Approach
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 396-397
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- July 2010
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Automated XPS Analysis of Passivated Stainless Steel to the SEMI Standard
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 436-437
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- July 2010
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Quantitative Characterisation of Surface and Interface Chemistry with X-ray Photoelectron Spectroscopy (XPS)
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 176-177
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- July 2009
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XPS and SEM/STEM Characterization of Silver Nanoparticles Formed from the X-ray-Induced and Thermal Reduction of Silver Behenate
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1298-1299
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- July 2009
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