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A Robust Basis for Grain Identification in Polycrystalline Thin Film Devices Using Cepstrum Transforms of 4D-STEM Diffraction Pattern
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1620-1622
- Print publication:
- August 2020
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Optimizing Process Parameters for the Growth of YBa2Cu3O7−δ thin-films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 191 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 141
- Print publication:
- 1990
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Crystallography of YBa2Cu3O6+x thin film-substrate interfaces
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- Journal:
- Journal of Materials Research / Volume 4 / Issue 5 / October 1989
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1072-1081
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- October 1989
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Grain Boundaries in Yba2 Cu3O7-δ Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 169 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 513
- Print publication:
- 1989
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