18 results
Large-Aperture STEM Hexapole Cs-Corrector
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2630-2632
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- August 2022
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Instrumental Resolution Limit By Magnetic Thermal Noise From Conductive Parts
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 598-599
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- August 2013
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Assessment of the TEM Information Limit by Means of Tilted Illumination
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 612-613
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- August 2013
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Realization of the First Aplanatic Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1270-1271
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- July 2011
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Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration
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- Microscopy and Microanalysis / Volume 16 / Issue 4 / August 2010
- Published online by Cambridge University Press:
- 02 July 2010, pp. 393-408
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- August 2010
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Benefits of Simultaneous Cc- and Cs-Correction
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 114-115
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- July 2010
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Development of Correctors: From O. Scherzer to TEAM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 150-151
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- July 2009
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First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1456-1457
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- July 2009
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Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008
- Published online by Cambridge University Press:
- 16 September 2008, pp. 469-477
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- October 2008
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Progress on the Development of a Cc/Cs Corrector for TEAM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 800-801
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- August 2008
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First Experimental Results with Advanced Hexapole Cs-Correctors
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 4-5
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- September 2007
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Experimental Set-up of an Advanced Hexapole Cs-Corrector
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1148-1149
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- August 2007
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State of the Development of a Cc & Cs Corrector for TEAM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1156-1157
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- August 2007
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Improvement Path for the Hexapole Cs-corrector Towards 0.5 A Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1468-1469
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- August 2006
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Benefits of a Cs-Corrector for Material Science
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 902-903
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- August 2001
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First Application of a Spherical-Aberration Corrected Microscope Material Science
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 384-385
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- July 1998
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Towards Sub-Ångstrom Resolution With A 200 Kv TEM By Means of a Cs-Corrector and a Computer Controlled Alignment Procedure
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 50-51
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- July 1998
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Seeing is Not Always Believing: Reduction of Artefacts by an Improved Point Resolution With a Spherical Aberration Corrected 200 Kv Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1179-1180
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- August 1997
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