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EELS Analyses of Gaseous Atmosphere and Heated Specimen in an ETEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 506-507
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- August 2013
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Applications of 40-120kV Analytical TEM for Nanoscience
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1328-1329
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- August 2013
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Development of an in-situ High Temperature-High Humidity TEM Observation Technique and Its Application to the Analysis of Catalyst Degradation Mechanism
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1162-1163
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- July 2012
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Development of an environmental cell for the H-9500 in-situ TEM and its application
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 302-303
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- July 2010
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3D Elemental Mapping Using a Dedicated STEM Equipped with a Real-Time EELS Imaging System
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1404-1405
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- August 2008
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9 - In-situ sample manipulation and imaging
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- Focused Ion Beam Systems
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- 12 January 2010
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- 13 September 2007, pp 250-267
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A Method for Site-specific Specimen Preparation of Si Device after 65 nm-node Technology using FIB-STEM/TEM System
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 790-791
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- August 2007
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In situ High Resolution TEM Observation of Solid-gas Reactions at High Temperatures
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 636-637
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- August 2007
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Development of a Multifunctional Specimen Heating Holder and its Application
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 976-977
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- August 2007
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Functionalized Holders for 3D S/TEM Imaging and Analysis of Nanoparticles
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1556-1557
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- August 2006
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Application of FIB Technique to 3D Observation of Resin Embedded Biological Tissues
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1232-1233
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- August 2006
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Observation of Gas-solid and Gas-liquid Reactions by In-situ Environmental Holder in TEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 764-765
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- August 2006
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A Method for 3 Dimensional Structural and Compositional Imaging of Nano-materials
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 528-529
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- August 2006
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Environmental Transmission Electron Microscopy Using a Conventional TEM and a Gas Injection-Specimen Heating Holder
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 766-767
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- August 2006
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3D Composition Imaging Using a Dedicated FIB/STEM System
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 630-631
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- August 2005
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High Temperature In-Situ Electron Microscopy Using A Dedicated Scanning Transmission Electron Micrscope
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 01 August 2003, pp. 922-923
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- August 2003
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FIB Micro-Pillar Sampling Technique For 3D Stem Observation And Its Application
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 06 August 2003, pp. 118-119
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- August 2003
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High Resolution Tem Observation and Eels Analysis of Carbon Nanotubes at Elevated Temperatures
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1152-1153
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- August 2002
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A Newly Developed Fib System For Tem Specimen Preparation
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 November 2002, pp. 48-49
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- August 2002
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Three Dimensional Characterization of a Specific Site by an FIB Micro-Sampling Technique
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 938-939
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- August 2001
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