6 results
Evaluation of Environmental Imaging for 200kV Field Emission Cs-corrected Analytical Scanning and Transmission Electron Microscope for Multi-User Facilities
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 918-919
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- July 2017
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STEM and TEM: Disparate Magnification Definitions and a Way Out.
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 56-57
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- July 2017
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Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 32-33
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- July 2016
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Centralized Instrument Control for a TEM Laboratory
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1394-1395
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- August 2013
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Development of STEM for the HT7700 TEM and Optimization of Digital-Image Detectors Arrangement
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1280-1281
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- July 2012
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Trials to Improve Image Quality in Electron Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1190-1191
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- July 2011
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