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Comparison of High Field Characteristics of SiO2 and AIN Gate Insulators in 6H SiC MOS Capacitors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 512 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 345
- Print publication:
- 1998
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Characterization of 4H-SiC MOS Capacitors by a Fast-Ramp Response Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 99
- Print publication:
- 1996
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- Article
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