The crystallization mechanism and kinetics of Cr2Ge2Te6 (CrGT) films were investigated by differential scanning calorimetry. The average Avrami exponent (na) analysis indicated that CrGT exhibits a growth-dominant crystallization in the range of heating rate (β) of 10–50°C/min. In comparison, Ge2Sb2Te5 (GST) showed a nucleation-dominant crystallization. The na of CrGT was about 3, and was majorly independent of β. The na of GST decreased with an increasing β, which asymptotically approached a value of around 3. The kinetic constant of CrGT was evaluated to be almost the same with that of GST, indicating that CrGT undergoes fast crystallization.