8 results
Pressure Dependence on the Electrical Properties of SiO2 Gate Oxide Formed by Inductive Coupled Plasma Oxidation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1287 / 2011
- Published online by Cambridge University Press:
- 15 July 2011, mrsf10-1287-f02-05
- Print publication:
- 2011
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Relationship Between Interfacial Adhesion and Dielectric Reliability of Cu Alloy Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 914 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0914-F09-18
- Print publication:
- 2006
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The Adhesion of Pad Particles on Wafer Surfaces during Cu CMP
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- Journal:
- MRS Online Proceedings Library Archive / Volume 867 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, W1.9
- Print publication:
- 2005
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High-temperature structural behavior of Ni/Au Contact on GaN(0001)
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 6 / 2001
- Published online by Cambridge University Press:
- 13 June 2014, e4
- Print publication:
- 2001
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Structural Evolution of Ni/Au Contact on GaN(0001)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 639 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, G11.7
- Print publication:
- 2000
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Structural evolution of GaN during initial stage MOCVD growth
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 5 / Issue S1 / 2000
- Published online by Cambridge University Press:
- 13 June 2014, pp. 252-258
- Print publication:
- 2000
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Post-irradiation sudden deafness
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- Journal:
- The Journal of Laryngology & Otology / Volume 113 / Issue 9 / September 1999
- Published online by Cambridge University Press:
- 29 June 2007, pp. 815-817
- Print publication:
- September 1999
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Sructural evolution of GaN during initial stage MOCVD growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 595 / 1999
- Published online by Cambridge University Press:
- 03 September 2012, F99W3.52
- Print publication:
- 1999
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