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Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1024-1025
- Print publication:
- August 2014
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Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 684-685
- Print publication:
- July 2012
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MOVPE of m-plane InGaN/GaN Buffer and LED Structures on γ-LiAlO2
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1068 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1068-C05-04
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- 2008
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