15 results
Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1760-1761
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- August 2019
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Polarity Determination in GaN Nanowires by Electron Backscatter Diffraction
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2404-2405
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- August 2019
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Electron Channelling Contrast Imaging in a Low Voltage Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 504-505
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- August 2019
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Non-destructive Imaging of Extend Defects in III-nitride Thin film Structures Using Electron Channelling Contrast Imaging
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 570-571
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- July 2017
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Mapping Anti-phase Domains by Polarity Sensitive Orientation Imaging Using Electron Backscatter Diffraction
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1522-1523
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- July 2017
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Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1024-1025
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- August 2014
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Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 684-685
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- July 2012
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Future Prospects for SEM-based Defect Analysis using Fast Electrons
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 608-609
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- July 2010
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Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1194-1195
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- August 2008
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Characterisation of Epitaxial Lateral Overgrown GaN by Electron Backscatter Diffraction Correlated with Cross-Sectional Cathodoluminescence Spectroscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1516-1517
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- August 2006
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Strain and Compositional Analysis of InGaN/GaN Layers
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- MRS Online Proceedings Library Archive / Volume 639 / 2000
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- 17 March 2011, G3.52
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- 2000
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Probing The Indium Mole Fraction In An Ingan Epilayer By Depth Resolved Cathodoluminescence
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- MRS Online Proceedings Library Archive / Volume 482 / 1997
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- 10 February 2011, 715
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- 1997
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Hexagonal Growth Hillocks in GaN Epilayers
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- MRS Online Proceedings Library Archive / Volume 449 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 471
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- 1996
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Growth and Optical Properties of GaN Grown by MBE on Novel Lattice-Matched Oxide Substrates
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- MRS Online Proceedings Library Archive / Volume 395 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 535
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- 1995
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The Effect of a GaN Nucleation Layer on GaN Film Properties Grown by Metalorganic Chemical Vapor Deposition
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- MRS Online Proceedings Library Archive / Volume 395 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 231
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- 1995
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