7 results
Correlative Analysis in the Semiconductor Industry
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2502-2503
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- August 2019
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Reconstruction Metrics in Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 336-337
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- August 2019
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Analysis of Bulk Dielectrics with Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1254-1255
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- August 2008
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Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1230-1231
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- August 2008
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Identification and Analysis of Fluorine Clustering in Boron Implants
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1250-1251
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- August 2008
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Arsenic Segregation to Dislocation Loops in Silicon
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 324-325
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- August 2008
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Three Dimensional Laser-assisted Atom-probe Tomography: Advanced Analysis of Si Nanostructures
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1738-1739
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- August 2006
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