3 results
Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 850-851
- Print publication:
- August 2008
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Comparison of Zone Axes for Convergent Beam Electron Diffraction Strain Measurements of a Strained Silicon Transistor
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 852-853
- Print publication:
- August 2008
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3-D Cross-Correlation of Atom Probe and STEM Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1042-1043
- Print publication:
- August 2008
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