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Advancing Atomic-Resolution TEM of Electron Beam-Sensitive Crystalline Materials from “Impossible” to “Routine”
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1676-1677
- Print publication:
- August 2019
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Cryo Focused Ion Beam Applications in High Resolution Electron Microscopy Studies of Beam Sensitive Crystals
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1402-1403
- Print publication:
- August 2019
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Quantitative Electron Diffraction for Crystal Structure Determination
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1184 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1184-GG01-04
- Print publication:
- 2009
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