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Quantitative Electron Diffraction for Crystal Structure Determination

Published online by Cambridge University Press:  31 January 2011

Peter Oleynikov ,
Daniel Grüner ,
Daliang Zhang ,
Junliang Sun ,
Xiaodong Zou  and
Sven Hovmöller
Peter Oleynikov
Affiliation:
oleyniko@struc.su.se, Stockholm University, Structural Chemistry, Stockholm, Sweden
Daniel Grüner
Affiliation:
danielg@inorg.su.se, Stockholm University, Inorganic Chemistry, Stockholm, Sweden
Daliang Zhang
Affiliation:
Daliangz@struc.su.se, Stockholm University, Structural Chemistry, Stockholm, Sweden
Junliang Sun
Affiliation:
Junliangs@struc.su.se, Stockholm University, Structural Chemistry, Stockholm, Sweden
Xiaodong Zou
Affiliation:
zou@struc.su.se, Stockholm University, Structural Chemistry, Stockholm, Sweden
Sven Hovmöller
Affiliation:
svenh@struc.su.se, Stockholm University, Structural Chemistry, Stockholm, Sweden
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Abstract

We present a quantitative investigation of data quality using electron precession, compared to standard selected-area electron diffraction (SAED). Data can be collected on a CCD camera and automatically extracted by computer. The critical question of data quality is addressed – can electron diffraction data compete with X-ray diffraction data in terms of resolution, completeness and quality of intensities?

Keywords

transmission electron microscopy (TEM)crystalcrystallographic structure

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