15 results
D-6 Invited—Different Aspects of Microstrain Broadening
-
- Journal:
- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 20 May 2016, p. 165
-
- Article
- Export citation
Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements
-
- Journal:
- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 20 May 2016, pp. 85-88
-
- Article
- Export citation
Anomalously high density and thermal stability of nanotwins in Ni(W) thin films: Quantitative analysis by x-ray diffraction
-
- Journal:
- Journal of Materials Research / Volume 29 / Issue 15 / 14 August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1642-1655
- Print publication:
- 14 August 2014
-
- Article
- Export citation
Evolution of microstructure and stress of and associated whisker growth on Sn layers sputter-deposited on Cu substrates
-
- Journal:
- Journal of Materials Research / Volume 25 / Issue 11 / November 2010
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2166-2174
- Print publication:
- November 2010
-
- Article
- Export citation
Transformation–dislocation dipoles in Laves phases: A high-resolution transmission electron microscopy analysis
-
- Journal:
- Journal of Materials Research / Volume 25 / Issue 10 / October 2010
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1983-1991
- Print publication:
- October 2010
-
- Article
- Export citation
High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si
-
- Journal:
- Journal of Materials Research / Volume 24 / Issue 11 / November 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 3294-3299
- Print publication:
- November 2009
-
- Article
- Export citation
Residual stress and strain-free lattice-parameter depth profiles in a γ′-Fe4N1-x layer on an α-Fe substrate measured by x-ray diffraction stress analysis at constant information depth
-
- Journal:
- Journal of Materials Research / Volume 24 / Issue 4 / April 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1342-1352
- Print publication:
- April 2009
-
- Article
- Export citation
Electron-diffraction study on ∈-iron nitride powders with various nitrogen contents: Variation of long-range nitrogen ordering
-
- Journal:
- Journal of Materials Research / Volume 21 / Issue 10 / October 2006
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2572-2581
- Print publication:
- October 2006
-
- Article
- Export citation
A new method for the determination of the diffusion-induced concentration profile and the interdiffusion coefficient for thin film systems by Auger electron spectroscopical sputter depth profiling
-
- Journal:
- Journal of Materials Research / Volume 19 / Issue 11 / November 2004
- Published online by Cambridge University Press:
- 01 November 2004, pp. 3389-3397
- Print publication:
- November 2004
-
- Article
- Export citation
Parameter determination of an analytical model for phase transformation kinetics: Application to crystallization of amorphous Mg–Ni alloys
-
- Journal:
- Journal of Materials Research / Volume 19 / Issue 9 / September 2004
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2586-2596
- Print publication:
- September 2004
-
- Article
- Export citation
Stress in Ag/Ni Multilayers: A Comparison of Specimen-Curvature and X-Ray Diffraction Methods
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 472 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 299
- Print publication:
- 1997
-
- Article
- Export citation
Highly Supersaturated, Highly Strained Sputtered Ag-Co and Ag-Ni Layers
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 472 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 63
- Print publication:
- 1997
-
- Article
- Export citation
A Thermodynamic Model for Solid State Amorphization: Application to Ni-Ti Multilayers of Different Microstructures
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 472 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 167
- Print publication:
- 1997
-
- Article
- Export citation
Ion beam synthesis of nitride layers in iron
-
- Journal:
- Journal of Materials Research / Volume 7 / Issue 10 / October 1992
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2689-2712
- Print publication:
- October 1992
-
- Article
- Export citation
Residual Stress in and Microstructure of Fe and Ti Surface Layers After 1 Mev N+ Implantation at High Dose
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 157 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 853
- Print publication:
- 1989
-
- Article
- Export citation