9 results
Exploiting Environmental Transmission Electron Microscopy Approaches to Understand the Origin of Carbon Nanotube Growth Termination
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 306-307
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Phase Transformations in Nanoscale Si-Au, Ge-Au and SiGe-Au Systems
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1718-1719
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Characterizing the performance of the FEI Titan environmental Transmission Electron Microscope / scanning Transmission Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 294-295
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Transmission Electron Microscopy Study of Defects in Nanopyramidal InGaN LEDs Structures
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1508-1509
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
New Insights into the Nanowire Nucleation and Growth Kinetics
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 196-197
- Print publication:
- August 2008
-
- Article
- Export citation
Exanding In-situ Mechanical Testing into the "Ultrafast" Regime
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 490-491
- Print publication:
- August 2008
-
- Article
- Export citation
Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 788-789
- Print publication:
- August 2008
-
- Article
- Export citation
Transmission Electron Microscopy of Polymer-Graphene Nanocomposites
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 590-591
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 70-71
- Print publication:
- August 2006
-
- Article
- Export citation