4 results
FIB Sample Preparation for In Depth EDS Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 914-915
- Print publication:
- August 2019
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Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 306-307
- Print publication:
- August 2014
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A Wide Area Scanning Atomic Force Profiler
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1106-1107
- Print publication:
- August 2004
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Multiple Analytical Instrumentation for Complete Materials Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 256-257
- Print publication:
- August 2003
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