4 results
High-resolution electron microscopy of diamond hexagonal silicon in low pressure chemical vapor deposited polycrystalline silicon
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- Journal:
- Journal of Materials Research / Volume 6 / Issue 11 / November 1991
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2324-2336
- Print publication:
- November 1991
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Comparison of Growth and Strain Relaxation of Si/Ge Superlattices Under Compressive and Tensile Strain Field
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- Journal:
- MRS Online Proceedings Library Archive / Volume 220 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 135
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- 1991
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New Relaxation Mechanism in Short Period Si/Ge Strained-Layer Superlattices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 183 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 155
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- 1990
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High-Resolution Electron Microscopy of Process-Induced Defects in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 183 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 67
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- 1990
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