4 results
Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 394-395
- Print publication:
- August 2020
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TEM Specimen Preparation Using a Low Energy Ion Beam for Nuclear Metallic Materials
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1608-1609
- Print publication:
- August 2019
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Analytical Electron Microscopy: Rivaling / Complementing Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2264-2265
- Print publication:
- August 2019
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Revealing Nanometre-scaled Solute Clusters in Neutron Irradiated Low Alloy Steels
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2198-2199
- Print publication:
- July 2017
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