5 results
Evaluation method of image resolution for the aberration-corrected STEM
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- Journal:
- / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1594-1595
- Print publication:
- August 2021
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Evaluation of High-Resolution STEM Imaging Advancement Under Gas-Environment with Open Window MEMS Holder and Gas Injection System
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- Journal:
- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 694-695
- Print publication:
- August 2019
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EDX Analysis of Low Concentration Dopant using HD-2700 Aberration Corrected STEM Equipped with Dual SDD
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- Journal:
- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2013-2014
- Print publication:
- August 2015
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Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs
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- Journal:
- / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 604-605
- Print publication:
- August 2014
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3-D Observation of Cu Particles Precipitated in Si by High-Angle Hollow-Cone Dark-Field Transmission Electron Microscopy
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- Journal:
- / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 479-480
- Print publication:
- August 1997
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