2 results
New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1104-1105
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 990-991
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation