10 results
Fine structures of Fe L-emission examined by a new HR-SXES instrument
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- Journal:
- / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1370-1371
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- August 2021
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Chemical State Mapping of Amorphous Carbon Films by Soft X-ray Emission Spectroscopy
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- Journal:
- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1754-1755
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- August 2019
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Information of Valence Charge of 3d Transition Metal Elements Observed in L-Emission Spectra
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 248-249
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- August 2019
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Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES
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- Journal:
- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 746-747
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- August 2018
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High-Energy Resolution Electron Energy-Loss Spectroscopy Study of Interband Transitions Characteristic to Single-Walled Carbon Nanotubes
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- Journal:
- / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 31 March 2014, pp. 807-814
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- June 2014
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Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry
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- / Volume 20 / Issue 3 / June 2014
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- 14 March 2014, pp. 692-697
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- June 2014
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Performance of Mirai-21 Analytical Electron Microscope
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- / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 858-859
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- August 2004
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Detection of Characteristic Signals from As-Doped (less than 1 at.%) Regions of Silicon by Transmission Electron Microscopy and Convergent-beam Electron Diffraction
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- / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 338-339
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- August 2004
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A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons
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- / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 1044-1045
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- August 2004
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Local Lattice Parameter Determination of Strained Areas of Semiconductors Using CBED
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- / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 310-311
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- August 2004
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