44 results
Phase Differentiation Based on X-ray Energy Spectrum Correlation with an Energy Dispersive Spectrometer (EDS)
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 602-603
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- August 2022
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Applications of a Triple Beam Microscope in Materials Science
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 22-23
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- August 2022
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Towards Quantitative Maps of Lithium in the Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 566-568
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- August 2022
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Characterization of Real Materials with Low Voltage STEM (30 kV): Current State and Challenges
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1318-1320
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- August 2021
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EDS of Lithium Materials from 0.5 to 30 keV
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1868-1869
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- August 2021
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Improving the Energy Resolution of Energy Dispersive Spectrometers(EDS) Using Richardson–Lucy Deconvolution
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1210-1211
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- August 2020
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Secondary Fluorescence Correction for Quantitative X-ray Microanalysis Integrated in a User-Friendly Framework
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 500-502
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- August 2020
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Low-voltage STEM-EELS Quantification for Beam Sensitive Material Characterization
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1206-1208
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- August 2020
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Is a 30 kV CFE-SEM in STEM-in-SEM Mode Suitable for Characterizing Real Materials?
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1218-1219
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- August 2020
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Extract High Resolution 3D Quantitative Elemental Map Using a Combined HAADF-STEM and EDS Tomography
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1854-1855
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- August 2020
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EELS Monitoring of Beam-Induced Dynamic Transformation of Lithium Materials at 30 keV
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2168-2169
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- August 2019
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EELS Analysis of Bulk Plasmon Harmonics of Aluminium at 30 keV
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 464-465
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- August 2018
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Monte Carlo Simulation of Surface Semi-Spherical Inclusions Using MC X-ray
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 740-741
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- August 2018
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Methods for Simulation of Electron Energy Loss Spectra for Low Energy Edges in Battery Materials
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 440-441
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- August 2018
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Low Voltage Analytical Possibilities in a Scanning Electron Microscope in Transmission Mode at 30 kV: EDS, EELS and CBED at the Nanoscale
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2036-2037
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- August 2018
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The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 640-641
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- August 2018
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Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral Characterization
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- Microscopy and Microanalysis / Volume 24 / Issue 3 / June 2018
- Published online by Cambridge University Press:
- 04 June 2018, pp. 238-248
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- June 2018
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Low Accelerating Voltage Scanning Transmitted Electron Microscope: Imaging, Diffraction, X-ray Microanalysis, and Electron Energy-Loss Spectroscopy at the Nanoscale
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 528-529
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- July 2017
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Quantification of Thin Specimens in a Scanning Transmission Electron Microscope at Low Accelerating Voltage using the f-ratio Method
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 236-237
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- July 2017
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The f-ratio Quantification Method for X-ray Microanalysis with a Field Emission SEM Applied to Multi-Elements Specimen
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1046-1047
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- July 2017
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