8 results
Aberration-corrected STEM Observations on the Interfacial Structure and Strain Fields of Patterned SrRuO3 Artificial Atoms
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 964-965
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- August 2019
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TEM Sample Preparation of Patterned Quantum Dots
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 790-791
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- August 2019
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3D Elemental Mapping in Nanomaterials by Core-Loss EFTEM Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1842-1843
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- July 2010
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ELNES Investigations of Interfaces in Abalone Shell
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1218-1219
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- July 2010
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Low-loss EFTEM Imaging of Surface Plasmon Resonances in Ag Nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1438-1439
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- July 2010
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Strain Mapping of 45 nm MOSFET by Dark-Field Inline Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 592-593
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- July 2010
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Application of Monochromated Electrons in EELS
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 134-135
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- August 2008
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The Sub-Electron-Volt-Sub-Angstrom-Microscope (SESAM): Pushing the Limits in Monochromated and Energy-Filtered TEM.
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 862-863
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- August 2007
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