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Structure-Property Relationships of Topological Insulator Nanomaterials
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 962-963
- Print publication:
- August 2019
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Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue 4 / August 2018
- Published online by Cambridge University Press:
- 03 September 2018, pp. 387-395
- Print publication:
- August 2018
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Thickness and Stacking Sequence Determination of Exfoliated Dichalchogenides Using Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1456-1457
- Print publication:
- July 2016
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Mapping Periodic Lattice Distortions in Exfoliated Dichalchogenides with Atomic Resolution cryo-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1550-1551
- Print publication:
- July 2016
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