4 results
Role of Defects and Structure Evolution across Ferroelectric Phase Transitions Studied by Quantitative Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2360-2361
- Print publication:
- August 2022
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Quantitative Aberration-Corrected STEM for Studies of Oxide Superlattices and Topological Defects in Layered Ferroelectrics
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1194-1195
- Print publication:
- August 2020
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Multimodal Chemical and Functional Imaging of Nanoscale Transformations Away from Equilibrium
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1042-1043
- Print publication:
- August 2018
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Nanofabrication Limits in Layered Ferroelectric Semiconductors via He-ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 262-263
- Print publication:
- July 2017
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