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Characterization of Nanoindentations in Silicon by Cross-sectional TEM
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 56-57
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- August 2004
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Cross-Sectional TEM Studies of Indentation-Induced Phase Transformations in Si: Indenter Angle Effects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 841 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, R10.4/T6.4
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- 2004
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Micro-Raman Mapping and Analysis of Indentation-Induced Phase Transformations in Germanium
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- Journal:
- MRS Online Proceedings Library Archive / Volume 841 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, R10.9T6.9
- Print publication:
- 2004
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Micro-Raman Mapping and Analysis of Indentation-Induced Phase Transformations in Germanium
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- Journal:
- MRS Online Proceedings Library Archive / Volume 843 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, T6.9/R10.9
- Print publication:
- 2004
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Cross-Sectional TEM Studies of Indentation-Induced Phase Transformations in Si: Indenter Angle Effects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 843 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, T6.4/R10.4
- Print publication:
- 2004
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Cracking and Phase Transformation in Silicon During Nanoindentation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 795 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, U8.15
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- 2003
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