5 results
Simulation of Capacitance-Voltage characteristics of Ultra-thin Metal-Oxide-Semiconductor Structures with Embedded Nanocrystals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1071 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1071-F02-11
- Print publication:
- 2008
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Characteristics of BST Capacitors with Aluminum Electrode and Iridium Oxide Barrier Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1034 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1034-K10-10
- Print publication:
- 2007
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Electrical Characteristics of BaxSr1-xTiO3(BST) Capacitors Implemented with Ti-Al Electrodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 928 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0928-GG14-10
- Print publication:
- 2006
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Characteristics of Lateral Capacitor Based on High-K Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 928 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0928-GG08-04
- Print publication:
- 2006
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Leakage Current and Dielectric Properties of Ba0.5Sr0.5TiO3 Films Deposited by RF Sputtering at Low Substrate Temperature
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- Journal:
- MRS Online Proceedings Library Archive / Volume 768 / 2003
- Published online by Cambridge University Press:
- 02 August 2011, G3.6
- Print publication:
- 2003
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