32 results
Atomic Structure of Through-Thickness Steps in a Grain Boundary
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 596-597
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Hierarchically Structured Precipitates in a Ferritic Alloy Characterized by Diffraction Contrast and Energy Filtered Imaging
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1472-1473
- Print publication:
- July 2012
-
- Article
- Export citation
Quantitative Composition Measurements of Atomic Columns Using STEM; Application to L12 Precipitates
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1262-1263
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
K-space Navigation for Accurate High-angle Tilting and Control of the TEAM Sample Stage
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1228-1229
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Atomic Resolution Imaging and Spectroscopy of Graphene Using the TEAM 0.5
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 124-125
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Quantitative Li Mapping in Al alloys by Sub-eV Resolution Energy-Filtering Transmission Electron Microscopy (EFTEM) in the Aberration-Corrected, Monochromated TEAM0.5 Instrument
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 430-431
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008
- Published online by Cambridge University Press:
- 16 September 2008, pp. 469-477
- Print publication:
- October 2008
-
- Article
- Export citation
Atomic Structure of Core-Shell Precipitates in Al-Li-Sc-Zr Alloys Studied by Analytical and Aberration-Corrected TEM/STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1348-1349
- Print publication:
- August 2008
-
- Article
- Export citation
Novel double-wedge sample preparation technique for quantitative TEM analysis of 3D structure in thin films and at buried interfaces
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 92-93
- Print publication:
- September 2007
-
- Article
- Export citation
Spinodal Decomposition of Geometrically Constrained CuNiFe Thin Films
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 522-523
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
EFTEM Imaging of ZnO-TiO2 Core-Shell Nanowires and TiO2 Nanotubes
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 474-475
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
Atomic Resolution Electron Tomography Based on Discrete Mathematics
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1566-1567
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
Characterization of As-Deposited Crystalline NiTi Thin Films
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 708-709
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
High-Speed, High-DQE Detectors For Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1482-1483
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
HREM and HAADF Imaging of Al3(Sc, Zr) Core/Shell Structure
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1712-1713
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
Synthesis of Magnetic Self-Assembled Nickel-Rich Oxide Nanowires Using a Novel Electrochemical Process
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 877 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, S7.4
- Print publication:
- 2005
-
- Article
- Export citation
Prospects for Bright Field and Dark Field Electron Tomography on a Discrete Grid
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 44-45
- Print publication:
- August 2004
-
- Article
- Export citation
A New Approach for Electron Tomography: ADF-TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 52-53
- Print publication:
- August 2004
-
- Article
- Export citation
Discrete Tomography of Ga and InGa Particles from HREM Image Simulation and Exit Wave Reconstruction
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 839 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, P4.5
- Print publication:
- 2004
-
- Article
- Export citation
Growth Mechanism of (111)-Textured 3C-SiC Films on Si(100) Substrates
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 21 July 2003, pp. 664-665
- Print publication:
- August 2003
-
- Article
-
- You have access
- Export citation