2 results
Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 4 / August 2020
- Published online by Cambridge University Press:
- 09 March 2020, pp. 750-757
- Print publication:
- August 2020
-
- Article
- Export citation
Correlative Analysis using FIB-ToF-SIMS and Atom Probe Tomography on Geological Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 684-685
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation