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An outlook on the potential of Si nanocrystals as luminescent probes for bioimaging

Published online by Cambridge University Press:  27 September 2012

Elisabetta Borsella
Affiliation:
ENEA, C.R. Frascati, I-00044 Frascati, Rome, Italy
Rosaria D’Amato
Affiliation:
ENEA, C.R. Frascati, I-00044 Frascati, Rome, Italy
Mauro Falconieri*
Affiliation:
ENEA, C.R. Casaccia, I-00123 Rome, Italy
Enrico Trave
Affiliation:
Department of Molecular Sciences and Nanosystems, Ca’ Foscari University, Dorsoduro 2137, I-30123 Venezia, Italy
Alice Panariti
Affiliation:
Department of Health Science, University of Milano-Bicocca, 4820900 Monza, Monza and Brianza, Italy
Ilaria Rivolta
Affiliation:
Department of Health Science, University of Milano-Bicocca, 4820900 Monza, Monza and Brianza, Italy
*
a)Address all correspondence to this author. e-mail: mauro.falconieri@enea.it
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Abstract

Silicon nanocrystals (Si-nc) present several plus points as advanced fluorescent biomarkers but suffer from difficulties met in controlling their intrinsic photoluminescence (PL). Here, we first consider the reasons for this difficulty, showing results that support an interface defect-related origin of the PL. Attainment of a controlled PL emission would then require tuning of defects in the capping oxide, a hard and yet unaddressed task. Alternatively, we demonstrate the possible use of Si-nc as antennas, or sensitizers, of a luminescent rare-earth ion in an engineered fluorophore. In this approach the relatively high and broadband optical absorption of Si-nc was exploited, keeping the advantages of a near-infrared inorganic light emitter. Another fundamental part of the assessment of Si-nc for bioimaging is their biocompatibility. Here, we report toxicity tests based on the lactate dehydrogenase release and 3-(4,5-dimethylthiazol-2-yl)-2,5-diphenyltetrazolium bromide assays on epithelial cells and fibroblasts, confirming that Si-nc in concentration suitable for luminescent labeling do not affect significantly the cells viability.

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Articles
Copyright
Copyright © Materials Research Society 2012

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References

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