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Electrical characterization of low defect density nonpolar (11¯20) a-plane GaN grown with sidewall lateral epitaxial overgrowth (SLEO)

  • Bilge Imer (a1), Benjamin Haskell (a1), Siddharth Rajan (a2), Stacia Keller (a2), Umesh K. Mishra (a2), Shuji Nakamura (a3), James S. Speck (a1) and Steven P. DenBaars (a3)...

Abstract

We studied the effect of extended defects on electrical characteristics of Si doped n-type nonpolar a-plane GaN films. The n-type GaN layers were grown on co-loaded reduced defect density sidewall lateral epitaxial overgrowth (SLEO) a-plane GaN templates and high defect density planar a-plane GaN templates by metalorganic chemical vapor deposition (MOCVD). The highest conductivity value was observed at the carrier concentration of 1.05 × 1019 cm−3 as 261.12 cm2/Vs for SLEO a-GaN and 106.77 cm2/Vs for the planar a-plane GaN samples. At the same doping level, the carrier compensation for SLEO samples was ∼12% less than planar samples.

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Corresponding author

a) Address all correspondence to this author. e-mail: bilge@engineering.ucsb.edu

References

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