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In situ X-ray Investigation of Hydrogen Charging in Thin Film Bimetallic Electrodes

  • Najeh M. Jisrawi (a1), Harold Wiesmann (a1), M. W. Ruckman (a1), T. R. Thurston (a1), G. Reisfeld (a1), B. M. Ocko (a1) and Myron Strongin (a1)
  • DOI:
  • Published online: 01 January 2011

Hydrogen uptake and discharge by thin metallic films under potentiostatic control was studied using x-ray diffraction at the National Synchroton Light Source (NSLS). The formation of metal-hydrogen phases in Pd, Pd-capped Nb, and Pd/Nb multilayer electrode structures was deduced from x-ray diffraction data and correlated with the cyclic voltammetry (CV) peaks. The x-ray data were also used to construct a plot of the hydrogen concentration as a function of cell potential for a multilayered thin film.

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4.S. R. Ovshinsky , M. A. Fetcenko , and J. Ross , Science 260, 176 (1993); S. R. Ovshinsky, H. Sapru, K. Dea, and K. C. Hong, U.S. Patent 4,431,561 (1984).

5.M. McCormack , M. E. Badding , B. Vyas , S. M. Zahurak , and D. W. Murphy , J. Electrochem. Soc. 143, L31 (1996).

6.G. W. D. Briggs , Electrochimica Acta 1, 297 (1959); J. N. Andrews and A. R. Ubbelohde, Proc. Roy. Soc. A 253, 6 (1959); S. Uno Falk, J. Electrochem. Soc. 107, 661 (1960); G. W. D. Briggs and W. F. K. Wynne-Jones, Electrochimica Acta 7, 241 (1962); A. J. Salkind and P. F. Bruins, J. Electrochem. Soc. 109, 356 (1962).

7.R. R. Chianelli , J. C. Scanlon , and B. M. L. Rao , J. Electrochem. Soc. 125, 1563 (1978).

8.M. Fleischmann and B. W. Mao , J. Electroanal. Chem. 229, 125 (1987).

9.G. Nazri and R. H. Muller , J. Electrochem. Soc. 132, 1385 (1985).

10.M. G. Samant , M. F. Toney , G. L. Borges , L. Blum , and O. R. Melroy , Surf. Sci. 193, L29 (1988).

11.G. D. Adzic , J. R. Johnson , J. J. Reilly , J. McBreen , S. Mukerjee , M. P. Sridhar-Kumar , W. Zhang , and S. Srinvasan , J. Electrochem. Soc. 142, 3429 (1995).

12.M. Latroche , A. Percheron-Guegan , Y. Chabre , C. Poinsignon , and J. Pannetier , J. Alloys and Compounds 189, 59 (1992).

16.G. Reisfeld , N. M. Jisrawi , M. W. Ruckman , and Myron Strongin , Phys. Rev. B 53, 4974 (1996).

17.R. A. Pasternak and B. Evans , J. Electrochem. Soc. 114, 452 (1967).

18.J. Wang , B. M. Ocko , A. J. Davenport , and H. Isaacs , Phys. Rev. B 46, 10, 321 (1992).

22.R. A. Bond and D. K. Ross , J. Phys. F 12, 597 (1982).

23.A. Capon and R. Parsons , J. Electroanal. Chem. 39, 275 (1972); R. R. Adzic, M. D. Spasojevic, and A. R. Despic, J. Electroanal. Chem. 92, 31 (1978); J. P. Chevillot, J. Farcy, C. Hinner, and A. Rousseau, J. Electroanal. Chem. 64, 39 (1975); J. Horkans, J. Electroanal. Chem. 106, 245 (1980); S. Szpak, P. A. Mosier-Boss, S. R. Scharber, and J. J. Smith, J. Electroanal. Chem. 337, 147 (1992).

25.T. Schöber and H. Wenzl , in Hydrogen in Metals II, edited by G. Alefeld and Völkl J. , Topics in Appl. Phys. (Springer-Verlag, Berlin, 1978), Vol. 28, p. 11.

26.H. Zabel and J. Peisl , J. Phys. F 9, 1461 (1979).

28.S. Moehlecke , C. F. Majkrzak , and M. Strongin , Phys. Rev. B 31, 6804 (1985).

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