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Volume 16 - Supplement S2 - July 2010

Contents

Page 7 of 50

Instrumentation and Techniques Symposia

Computational Aspects of Data Visualization and Quantitative Microscopy and Microanalysis

Abstract

  • Atomic-Scale EELS Maps: It’s Not Resolution, But Contrast

  • HL Xin, L Fitting-Kourkoutis, JA Mundy, H Zheng, DA Muller
  • Published online by Cambridge University Press:
    01 August 2010, pp. 242-243
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Rapid Methods for Dynamic Autotuning

  • AR Lupini, SJ Pennycook
  • Published online by Cambridge University Press:
    01 August 2010, pp. 244-245
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Image Simulations of Defect Images in STEM Observation Mode

  • M De Graef
  • Published online by Cambridge University Press:
    01 August 2010, pp. 246-247
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Bloch State Contributions to Dopant Atom Contrast in HAADF STEM

  • BG Mendis
  • Published online by Cambridge University Press:
    01 August 2010, pp. 248-249
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Long-range Order Parameter Determination by Convergent Beam Electron Diffraction

  • KL Torres, RR Vanfleet, GB Thompson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 250-251
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Aberration-Corrected STEM Image Simulation of Segregation in Pt3Co Nanoparticles for PEM Fuel Cells

  • BN Patrick, LF Allard, Jr, Y Shao-Horn, PJ Ferreira
  • Published online by Cambridge University Press:
    01 August 2010, pp. 252-253
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Monte Carlo Simulation of Inelastic Collisions of Electrons in Solids

  • F Salvat, D Bote, J Fernández-Varea
  • Published online by Cambridge University Press:
    01 August 2010, pp. 254-255
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Quantitative X-Ray Microanalysis of Real Materials in Electron Microscopy with Monte Carlo Simulations

  • R Gauvin, P Michaud, ML Trudeau
  • Published online by Cambridge University Press:
    01 August 2010, pp. 256-257
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • CASINO Monte Carlo simulations of Scanning Transmission Electron Microscopy

  • H Demers, N Poirier-Demers, N de Jonge, D Drouin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 258-259
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • XUtils Ver. 1: A Set of Gatan DigitalMicrograph Plug-ins for Characterization of XEDS-Detector Performance Parameters in an AEM

  • M Watanabe
  • Published online by Cambridge University Press:
    01 August 2010, pp. 260-261
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Low-Voltage X-Ray Microanalysis with an Annular Si-Drift Detector

  • PG Kotula, MT Brumbach
  • Published online by Cambridge University Press:
    01 August 2010, pp. 262-263
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Fast Electron Beam Switching in Dielectric Samples

  • H-J Fitting, M Touzin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 264-265
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • An Examination of Defects in Diamond Using Data Clustering

  • NC Wilson, CM MacRae, A Torpy, J Boland, EP Vicenzi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 266-267
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • An Extremely Fast and Efficient Hierarchical Clustering Algorithm Applicable to Hyperspectral Microscopy and Microanalysis Images

  • CL Stork
  • Published online by Cambridge University Press:
    01 August 2010, pp. 268-269
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Multivariate Statistical Analysis of Atom Probe Tomography Data

  • MR Keenan, VS Smentkowski, RM Ulfig, E Oltman, DJ Larson, TF Kelly
  • Published online by Cambridge University Press:
    01 August 2010, pp. 270-271
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Effects of Higher-Order Laue Zone Reflections on Atomic Resolution TEM Images of Single Layer and Bilayer Graphene

  • HS Kim
  • Published online by Cambridge University Press:
    01 August 2010, pp. 274-275
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Multivariate Curve Resolution to Determine Fully-Embedded-Particle Compositions in STEM-EDS Spectrum Images

  • CM Parish
  • Published online by Cambridge University Press:
    01 August 2010, pp. 276-277
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • MC X-Ray, The Monte Carlo Program for Quantitative Electron Microscopy of Real Materials

  • P Michaud, R Gauvin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 278-279
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • An API/GUI for Monte Carlo simulation of EPMA spectra using PENELOPE

  • PT Pinard, H Demers, F Salvat, R Gauvin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 280-281
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 7 of 50