Articles
- Phase Transformation and Microstructural Properties in Sputtered Vs. CVD WSi, Films
- https://doi.org/10.1557/PROC-441-3
- Published online: 10 February 2011, 3
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- Structural and Surface Morphology Changes in CuInSe2 Thin Films as a Function of Cu/In Ratio
- https://doi.org/10.1557/PROC-441-9
- Published online: 10 February 2011, 9
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- Phase Selection by Competitive Growth in Ti/Al Thin Film Diffusion Couples
- https://doi.org/10.1557/PROC-441-15
- Published online: 10 February 2011, 15
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- The Effect of Growth Temperature on Atomic Ordering in Gao.5 2Ino.48P Epilayers Grown on GaAs (001) Substrates by GS-MBE
- https://doi.org/10.1557/PROC-441-21
- Published online: 10 February 2011, 21
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- Structural and Chemical Properties of MBE Grown Niobium Overlayers on (110) Rutile
- https://doi.org/10.1557/PROC-441-27
- Published online: 10 February 2011, 27
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- Initial Buffer Layers on the Growth of InGaP on Si by MBE
- https://doi.org/10.1557/PROC-441-33
- Published online: 10 February 2011, 33
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- Real-time Characterization of the Optical Properties of an ultra-thin Surface Reaction Layer during Growth
- https://doi.org/10.1557/PROC-441-39
- Published online: 10 February 2011, 39
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- Slow Decay of Reflection High Energy Electron Diffraction Oscillations in Cal1-xMgxF2
- https://doi.org/10.1557/PROC-441-45
- Published online: 10 February 2011, 45
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- Observation of Rheed Intensity Oscillations During PbSe/CaF2/Si(111) MBE
- https://doi.org/10.1557/PROC-441-51
- Published online: 10 February 2011, 51
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- STM and X-Ray Diffraction Temperature-Dependent Growth Study of SrRuO3 PLD Thin Films
- https://doi.org/10.1557/PROC-441-57
- Published online: 10 February 2011, 57
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- A Study on the Growth of a Ferroelectric Thin Film Using Ionized Cluster Beam Epitaxy Technique and the Application for Ulsi Fabrication
- https://doi.org/10.1557/PROC-441-63
- Published online: 10 February 2011, 63
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- Observation of Film Growth Phenomena Using Micromachined Structures
- https://doi.org/10.1557/PROC-441-69
- Published online: 10 February 2011, 69
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- Effect of Non-Hydrostatic Stress on Kinetics and Interfacial Roughness During Solid Phase Epitaxial Growth in Si
- https://doi.org/10.1557/PROC-441-75
- Published online: 10 February 2011, 75
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- GaxIn1-xP/GaP Heterostructures on Si(001) Substrate
- https://doi.org/10.1557/PROC-441-81
- Published online: 10 February 2011, 81
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- Lateral grain growth in poly-Si films by gas flame high temperature annealing
- https://doi.org/10.1557/PROC-441-89
- Published online: 10 February 2011, 89
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- Competitive Motions of Grain-Boundary and Free Surface in Selecting Thin Film Morphology
- https://doi.org/10.1557/PROC-441-95
- Published online: 10 February 2011, 95
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- A Study on the Metal Induced Lateral Crystallization Behavior of Amorphous Silicon Thin Films
- https://doi.org/10.1557/PROC-441-101
- Published online: 10 February 2011, 101
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- Effects of Addition of Heavy Rare-Earth Elements on the Structures and Resistivities of Al Thin Films for TFT - LCD Interconnects
- https://doi.org/10.1557/PROC-441-107
- Published online: 10 February 2011, 107
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- Low Pressure OMVPE Grown Compressive Strained Ingaas QWS Surrounded by Tensile Strained Ingaas Spacers
- https://doi.org/10.1557/PROC-441-113
- Published online: 10 February 2011, 113
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- Formation and Properties of Roughened Poly-Si Electrodes for High-Density Drams
- https://doi.org/10.1557/PROC-441-119
- Published online: 10 February 2011, 119
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