Powder Diffraction: Volume 19 -

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Powder Diffraction

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Volume 19 - June 2004

Denver X-Ray Conference

D-3 SAXSess—An Analytical Tool for Nanostructured Materials

D-15 Crystalline or Liquid Crystalline? A XRD Study on Octasubstituted Discotic Phthalocyanines

F-47 Quantitative Procedures in TXRF—Invited

F-25 Advanced Pulse Processing and Analytical Methods for Quantitative Energy Dispersive XRF and Micro-EDXRF—Invited

F-19 Development of a Monte Carlo—Library Least-Squares (MCLLS) Code Package for the EDXRF Inverse Problem—Invited

F-26 Micro-XRF Analysis of Thin Films and Coatings Using Fundamental Parameters

F-5 The Role of Standards Australia in Achieving and Maintaining Accuracy and Precision in Lithium Borate Fusion—XRF Spectrometric Analysis

F-36 Quantitative Analysis of Single Particles by Combination of X-ray Microanalysis and Monte Carlo Simulations

C-7 A New Ultra Fast and Low Noise X-ray Detector System—Invited

C-8 Modelling the Response of Silicon X-ray Detectors

C-4 Improving Energy Stability in the NIST Microcalorimeter X-ray Detector

F-9 Progress with Silicon Drift Detectors Used for High Resolution—High Count Rate X-ray Spectroscopy

F-10 Large Area Silicon Drift Detectors for XRF Applications

D-49 The Influence of X-ray Tube and Detector Settings on the Peak-to-Background Ratio of the Powder Diffractogram

D-31 High-Resolution Synchrotron Radiation XRD and Microstructure Imaging in 6-DIM Orientation-Location Space by the Moving Area Detector Method—Invited

D-8 Materials Science Applications of the Three Dimensional X-ray Diffraction Microscope

D-116 Texture of Nisi Films on Single Crystal Silicon—Invited

D-63 High Energy X-ray Diffraction Investigation of the Ferroelectric Behavior of (Pb,La)(Zr,Ti)O3

D-64 In-Situ Study of Oxide Growth on a Kanthal Alloy

D-105 Transient Stress Effects in Thin Films Determined by X-ray Diffraction—Invited

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Volume 19 - June 2004

Denver X-Ray Conference