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F-10 Large Area Silicon Drift Detectors for XRF Applications

Published online by Cambridge University Press:  20 May 2016

O. Boslau
Affiliation:
Ketek GmbH, München, Germany
T. Eggert
Affiliation:
Ketek GmbH, München, Germany
P. Goldstraϐ
Affiliation:
Ketek GmbH, München, Germany
J. Kemmer
Affiliation:
Ketek GmbH, München, Germany

Abstract

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Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2004

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