Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 15 supplement s2
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 15 - Supplement S2 - July 2009

Contents

Page 11 of 39

Instrumentation and Techniques

Metals and Minerals and Microstructure: Applications and Advances of Electron Backscatter Diffraction (EBSD)

Abstract

  • Structure and Orientation Determination of Metal-Oxide Nanostructures by Electron Backscatter Diffraction

  • YN Picard, L Mazeina, S Maximenko, J Freitas, S Prokes, ME Twigg
  • Published online by Cambridge University Press:
    26 July 2009, pp. 402-403
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Study on the Formation of P Orientation in CC Al-Mn-Mg Alloy by EBSD Method

  • Q Zeng, T Zhai
  • Published online by Cambridge University Press:
    26 July 2009, pp. 404-405
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A 3D EBSD Investigation of Dynamic Recrystallisation in a Cu-Sn Bronze

  • A Gholinia, I Brough, J Humphreys, D McDonald, P Bate
  • Published online by Cambridge University Press:
    26 July 2009, pp. 406-407
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Through-thickness Grain Structure of Metal-oxide Films Using EBSD

  • DM Feldmann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 408-409
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Low Energy, Low Angle, Large Area Ion Polishing for Improved EBSD Indexing

  • S Walck, J Porter, H-W Yang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 410-411
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microstructure Evolution During Creep and Annealing of Minerals and Rocks

  • E Mariani, DJ Prior, SJ Covey-Crump, J Mecklenburgh, D Tatham, J Wheeler
  • Published online by Cambridge University Press:
    26 July 2009, pp. 412-413
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Information Depth and Kikuchi Band Contrast in Electron Backscatter Diffraction Patterns

  • A Winkelmann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 414-415
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Resolution Surface Morphology Measurements using EBSD Cross-Correlation Techniques and AFM,

  • MD Vaudin, G Stan, YB Gerbig, RF Cook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 416-417
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Interactive EBSD Based Analysis of a Fatigue Crack in a Nickel Superalloy

  • MM Nowell, SI Wright, R de Kloe
  • Published online by Cambridge University Press:
    26 July 2009, pp. 418-419
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterizing Ultrafine Grained Material using EBSD

  • A Deal, R Bhat, R DiDomizio, J Marte, PR Subramanian
  • Published online by Cambridge University Press:
    26 July 2009, pp. 420-421
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of Tools to Increase the Spatial Resolution of EBSD Maps

  • PT Pinard, P Hovington, M Lagacé, R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 422-423
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of CVD Graphene Films on Ni Substrate by EBSD and Low-kV EDS

  • DC Bell, N Erdman, J Kong, A Reina
  • Published online by Cambridge University Press:
    26 July 2009, pp. 424-425
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF

Abstract

  • Quantitative Analysis of Alloy Structure by Aberration Corrected STEM

  • M Weyland, B Muddle
  • Published online by Cambridge University Press:
    26 July 2009, pp. 426-427
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Energy-Loss Spectrometry (EELS) and Energy-Filtered TEM (EFTEM) Analyses of Organic-Inorganic Nanoparticles

  • AL Koh, M Watanabe, R Sinclair
  • Published online by Cambridge University Press:
    26 July 2009, pp. 432-433
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Scale EELS Study of the Origin of Ferromagnetism in Co doped ZnO Epitaxial Thin Films

  • QM Ramasse, AP Kuprin, M Chi, TC Kaspar, SA Chambers, ND Browning
  • Published online by Cambridge University Press:
    26 July 2009, pp. 436-437
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Automated Mapping of Multiple Elements for Dose-Efficient Elemental Quantification using EFTEM

  • A Aitouchen, P Thomas
  • Published online by Cambridge University Press:
    26 July 2009, pp. 438-439
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Structural and Chemical Details of La05Sr0.5CoO3-δ Thin Films

  • J Gazquez, M Varela, MP Oxley, W Luo, ST Pantelides, MA Torija, M Sharma, C Leighton, SJ Pennycook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 440-441
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 11 of 39