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Volume 15 - Supplement S2 - July 2009

Contents

Page 13 of 39

Instrumentation and Techniques

Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF

Abstract

  • Fe Distribution in Zr-2.5Nb Pressure Tubes Having Variable Deformation Properties

  • ML Trudeau, AM Serventi, R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 482-483
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Exploration of Nanocomposition in Biphasic Polymer Nanocolloids Using a Multivariate Histogram Method Combined with Cryo-VEELS

  • G Kim, D Meyers
  • Published online by Cambridge University Press:
    26 July 2009, pp. 484-485
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Visualization and Simulation Optimization of PENELOPE through a Graphical Interface

  • PT Pinard, H Demers, F Salvat, R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 486-487
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials

  • R Gauvin, P Michaud
  • Published online by Cambridge University Press:
    26 July 2009, pp. 488-489
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Low-loss Energy-filtered Transmission Electron Microscopy for Imaging and Analysis of Nanoparticles

  • A Merkle, S Pokrant, S Irsen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 490-491
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Electrodeposited Copper Films with Time-of-Flight SIMS

  • H Demers, U Emekli, E Lifshin, AC West
  • Published online by Cambridge University Press:
    26 July 2009, pp. 492-493
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Position Averaged Convergent Beam Electron Diffraction

  • J LeBeau, S Findlay, L Allen, S Stemmer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 494-495
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Failure Analyses: Practical Metallography/Fractography in Case Studies

Abstract

  • Failure Analysis Problem Solving Using Metallography

  • F Hogue
  • Published online by Cambridge University Press:
    26 July 2009, pp. 496-497
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Contact Resistance in Spring Loaded Micro-Switches

  • K Wasag
  • Published online by Cambridge University Press:
    26 July 2009, pp. 498-499
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Counting on Fatigue- Striations and Their Measure

  • P DeVries, K Ruth, D Dennies
  • Published online by Cambridge University Press:
    26 July 2009, pp. 500-501
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fractographic Analyses of Creep and Fatigue Induced Failures in an Alpha Titanium-Aluminum Alloy

  • MC Brandes, A Bhattacharjee, MJ Mills, JC Williams
  • Published online by Cambridge University Press:
    26 July 2009, pp. 502-503
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Impact Fatigue Failure of Ordnance Components

  • F Schmidt, D Norfleet
  • Published online by Cambridge University Press:
    26 July 2009, pp. 504-505
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Disastrous Failure of a Carbide-Studded Cutting Disc

  • M Panzenböck
  • Published online by Cambridge University Press:
    26 July 2009, pp. 506-507
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Grain Structure at Crack Path in Fatigued Nano-Crystalline Ni

  • L-C Lai, W-A Chiou, JC Earthman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 508-509
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Problem Solving Using Microanalysis in the Real World

Abstract

  • A Multifaceted Approach to Particle Analysis

  • H Lowers
  • Published online by Cambridge University Press:
    26 July 2009, pp. 510-511
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Using DTSA-II to Simulate and Interpret an X-ray Spectrum Image from a K411 Microparticle

  • N Ritchie
  • Published online by Cambridge University Press:
    26 July 2009, pp. 512-513
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Use of Multilayer Correction Procedures to Improve the Quantitative Electron Microprobe Analyses of Coated Insulating Specimens

  • J Armstrong
  • Published online by Cambridge University Press:
    26 July 2009, pp. 514-515
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Probe Microanalysis of Thin Films and Multilayers Using the X-FILM Computer Code

  • X Llovet, C Merlet
  • Published online by Cambridge University Press:
    26 July 2009, pp. 516-517
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Challenges Involved In X-Ray Microanalysis Of The Mineral Kernite [Na2B4O6(OH)2P3H2O]

  • EP Vicenzi, D Meier, JM Davis
  • Published online by Cambridge University Press:
    26 July 2009, pp. 518-519
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Calculating the Detector Solid Angle in X-ray Energy Dispersive Spectroscopy

  • NJ Zaluzec
  • Published online by Cambridge University Press:
    26 July 2009, pp. 520-521
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 13 of 39