Skip to main content Accessibility help
×
Hostname: page-component-848d4c4894-8kt4b Total loading time: 0 Render date: 2024-06-19T01:23:36.532Z Has data issue: false hasContentIssue false

7 - X-ray analysis (1)

Published online by Cambridge University Press:  03 December 2009

S. J. B. Reed
Affiliation:
University of Cambridge
Get access

Summary

Introduction

Qualitative X-ray analysis entails the identification of the elements present in a given sample, or the identification of phases from the elements which they contain. Of the two available sorts of X-ray spectrometer, the ED type is far better for qualitative analysis, owing to its ability to record complete spectra rapidly (major elements and their approximate relative concentrations are apparent in only a few seconds). Occasionally, though, ambiguity in the identification of peaks closely similar in energy requires the better resolution obtainable with a WD spectrometer.

For quantitative analysis X-ray line intensities emitted from the specimen are measured and elemental concentrations are calculated from the ratios of these intensities to those from standard samples with known concentrations. Methods of measuring intensities and correcting for background differ in WD and ED analysis, which are therefore treated separately below. The ‘matrix’ (or ‘ZAF’) corrections required in order to allow for the effect of the difference in composition between standard and specimen on the emitted intensities are common to both methods of analysis.

Pure-element X-ray spectra

The origin of characteristic X-rays is described in Section 2.5.2. The K lines of elements of atomic number 11–30 (Na–Zn) lie within the energy range 1–10 keV. Elements of higher atomic number can be identified from their L or M lines, which lie in the same range. With a thin-window ED detector (Section 5.2.1), the atomic-number range can be extended down to 4 (Be).

Type
Chapter
Information
Publisher: Cambridge University Press
Print publication year: 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Save book to Kindle

To save this book to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

  • X-ray analysis (1)
  • S. J. B. Reed, University of Cambridge
  • Book: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
  • Online publication: 03 December 2009
  • Chapter DOI: https://doi.org/10.1017/CBO9780511610561.008
Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

  • X-ray analysis (1)
  • S. J. B. Reed, University of Cambridge
  • Book: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
  • Online publication: 03 December 2009
  • Chapter DOI: https://doi.org/10.1017/CBO9780511610561.008
Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

  • X-ray analysis (1)
  • S. J. B. Reed, University of Cambridge
  • Book: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
  • Online publication: 03 December 2009
  • Chapter DOI: https://doi.org/10.1017/CBO9780511610561.008
Available formats
×