10 results
Electrical characterization of defect states in local conductivity domains in ZnO:N,As layers
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- Journal:
- Journal of Materials Research / Volume 22 / Issue 7 / July 2007
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1775-1778
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- July 2007
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Electrical Characterization of Defect States in Local Conductivity Domains in ZnO:N,As Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 957 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0957-K08-03
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- 2006
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Deep Defects in Fe-Doped GaN Layers Analysed by Electrical and Photoelectrical Spectroscopic Methods
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- Journal:
- MRS Online Proceedings Library Archive / Volume 798 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Y5.37
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- 2003
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Fermi Level Pinning at GaN-interfaces: Correlation of electrical admittance and transient spectroscopy
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 5 / Issue S1 / 2000
- Published online by Cambridge University Press:
- 13 June 2014, pp. 936-942
- Print publication:
- 2000
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Fermi Level Pinning at GaN-Interfaces: Correlation of Electrical Admittance and Transient Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 595 / 1999
- Published online by Cambridge University Press:
- 03 September 2012, F99W11.82
- Print publication:
- 1999
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Electrical and Photoelectrical Characterization of Deep Defects In Cubic GaN on GaAs
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
- Published online by Cambridge University Press:
- 13 June 2014, pp. 185-190
- Print publication:
- 1999
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Defect States in SiC/GaN- and SiC/AlGaN/GaN- Heterostructures Characterized by Admittance and Photocurrent Spectroscopy
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
- Published online by Cambridge University Press:
- 13 June 2014, pp. 388-396
- Print publication:
- 1999
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Defect States in SiC/GaN-and SiC/AlGaN/GaN-Heterostructures Characterized by Admittance and Photocurrent Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 537 / 1998
- Published online by Cambridge University Press:
- 15 February 2011, G3.71
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- 1998
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Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 537 / 1998
- Published online by Cambridge University Press:
- 15 February 2011, G3.14
- Print publication:
- 1998
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Deep Trap Characterization In GaN Using Thermal And Optical Admittance Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 482 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 887
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- 1997
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