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Relationship of subjective sleep quality, daytime sleepiness, and depression to the quality of life in patients with parkinson's disease
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- European Psychiatry / Volume 22 / Issue S1 / March 2007
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- 16 April 2020, p. S339
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Subjective sleep quality and aggression in antisocial personality disorder
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- European Psychiatry / Volume 22 / Issue S1 / March 2007
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- 16 April 2020, p. S288
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Subjective sleep quality and aggression in antisocial personality disorder
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- European Psychiatry / Volume 22 / Issue S1 / March 2007
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- 16 April 2020, pp. S266-S267
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Smartphone Addiction in Relation with Social Anxiety and Loneliness Among University Students in Turkey
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- European Psychiatry / Volume 30 / Issue S1 / March 2015
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- 15 April 2020, p. 1
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D-40 Nanodiffraction From Perfect/Weakly-Deformed Single Crystals
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- Powder Diffraction / Volume 23 / Issue 2 / June 2008
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- 20 May 2016, p. 178
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D133 X-ray Diffraction at IBM - Invited
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
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- 20 May 2016, p. 179
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D-61 Invited—Toward Nanometer Resolution for Strain Mapping in Single Crystals: New Focusing Optics and Dynamical Diffraction Artifacts
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- Powder Diffraction / Volume 22 / Issue 2 / June 2007
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- 20 May 2016, p. 180
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D105 Effect of Beam Divergence on Strain Data from Neutron Diffraction
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
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- 20 May 2016, p. 178
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D123 Strain Effects in Thin Film / SI Substrates Revealed by X-ray Microdiffraction
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
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- 20 May 2016, p. 176
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D-109 Sampling Volume Concerns in Micro X-ray Diffraction—Invited
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
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- 20 May 2016, p. 203
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D-104 Inverse Analysis of Neutron Diffraction Data
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- Powder Diffraction / Volume 22 / Issue 2 / June 2007
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- 20 May 2016, p. 182
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Strain effects in thin film/Si substrates revealed by X-ray microdiffraction
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- Powder Diffraction / Volume 19 / Issue 1 / March 2004
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- 06 March 2012, pp. 56-59
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Measurement volume considerations in X-ray microdiffraction stress analysis
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
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- 06 March 2012, pp. 104-109
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Spatially transient stress effects in thin films by X-ray diffraction
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
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- 01 March 2012, pp. 112-116
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Mechanics of microelectronics structures as revealed by X-ray diffraction
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- Powder Diffraction / Volume 22 / Issue 2 / June 2007
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- 01 March 2012, pp. 98-102
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Nanoscale strain characterization in microelectronic materials using X-ray diffraction
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
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- 29 February 2012, pp. 108-113
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Real-space strain mapping of SOI features using microbeam X-ray diffraction
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- Powder Diffraction / Volume 23 / Issue 2 / June 2008
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- 29 February 2012, pp. 106-108
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PROBING STRAIN FIELDS ABOUT THIN FILM STRUCTURES USING X-RAY MICRODIFFRACTION
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- MRS Online Proceedings Library Archive / Volume 795 / 2003
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- 01 February 2011, U7.3
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- 2003
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Mechanisms for Microstructure Evolution in Electroplated Copper Thin Films
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- MRS Online Proceedings Library Archive / Volume 562 / 1999
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- 10 February 2011, 223
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- 1999
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Mechanisms for Microstructure Evolution in Electroplated Copper Thin Films
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- MRS Online Proceedings Library Archive / Volume 564 / 1999
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- 10 February 2011, 387
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- 1999
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