Hostname: page-component-89b8bd64d-46n74 Total loading time: 0 Render date: 2026-05-08T18:45:45.046Z Has data issue: false hasContentIssue false

Measurement volume considerations in X-ray microdiffraction stress analysis

Published online by Cambridge University Press:  06 March 2012

I. C. Noyan*
Affiliation:
International Business Machines Corporation, Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598
S. K. Kaldor
Affiliation:
International Business Machines Corporation, Microelectronics Division, Hopewell Junction, New York 12533
*
a)Author to whom correspondence should be addressed; Electronic mail: noyan@us.ibm.com
Get access

Abstract

The Lorenz-polarization (LP) factor, which is used for X-ray intensity calculations from polycrystalline materials, contains a term that describes the fraction of diffracting grains in the irradiated sample volume. We present extensions of this term and a series of experiments that tests its applicability. The implications of the analysis on microbeam diffraction are also discussed.

Information

Type
Special Section on Microanalysis
Copyright
Copyright © Cambridge University Press 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable