36 results
Failure Analysis of Trace Elements and Surfaces Using Hitachi Dedicated STEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 724-725
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- August 2019
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Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 1066-1067
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- August 2014
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Application of Low Energy Broad Ion Beam Milling to Improve the Quality of FIB Prepared TEM Samples
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1326-1327
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- August 2013
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Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 702-703
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- August 2013
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Electron Tomography of Stacked Contact/Via Structures
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1798-1799
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- July 2012
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Strain Profiles in Si Channel of PMOS Devices Affected by Shallow-Trench Isolation Strain Relaxation In Embedded SiGe
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1924-1925
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- July 2010
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Challenging Analysis for the Gate Stack and Strained Channel of the Advanced CMOS
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 384-385
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- August 2008
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Local Strain Measurement by Geometrical Phase Analysis in the Transmission Electron Microscope Applied to Strain-Engineered CMOS Devices
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 388-389
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- August 2008
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Strain Measurements Using Nano-Beam Diffraction on a FE-STEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 836-837
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- August 2007
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Micropatterned lead zirconium titanate thin films
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- Journal of Materials Research / Volume 18 / Issue 5 / May 2003
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- 31 January 2011, pp. 1259-1265
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- May 2003
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Correlation of resistance and interfacial reaction of contacts to n-type InP
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- Journal of Materials Research / Volume 17 / Issue 11 / November 2002
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- 31 January 2011, pp. 2929-2934
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- November 2002
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Energy Dispersive Spectrometry Calibration For The HD -2000 STEM
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 1192-1193
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- August 2002
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Novel resistance reduction and phase changes of contacts to n-type InP by rapid thermal annealing
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- MRS Online Proceedings Library Archive / Volume 744 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, M5.47
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- 2002
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Effect of current crowding on contact failure in heavily doped n+- and p+-silicon-on-insulator
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- Journal of Materials Research / Volume 15 / Issue 11 / November 2000
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- 31 January 2011, pp. 2387-2392
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- November 2000
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Calibration Method for Elemental Quantification
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 536-537
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- August 2000
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Comparison of Elemental Detection Using Microcalorimetry, SIMS, AES and EDS (SEM, STEM, and TEM)
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 128-129
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- August 2000
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Patterning of GaN in High-Density Cl2- and BCl3-Based Plasmas
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- MRS Online Proceedings Library Archive / Volume 468 / 1997
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- 10 February 2011, 355
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- 1997
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Cl2-Based Dry Etching Of The AIGaInN System In Inductively Coupled Plasmas
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- MRS Online Proceedings Library Archive / Volume 483 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 327
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- 1997
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ICP Dry Etching of III-V Nitrides
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- MRS Online Proceedings Library Archive / Volume 468 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 393
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- 1997
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Wet Chemical Etching Survey Of III-Nitrides
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- MRS Online Proceedings Library Archive / Volume 483 / 1997
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- 10 February 2011, 265
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- 1997
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